Device Fabrication & Measurements

Device Fabrication and Measurements Laboratories include e-beam lithography system (Roberts 140, MSE Department), micro-contact printing (Bagley 195, Xia), and dip-pen lithography and vacuum deposition (Bagley 13B, Ginger). Device measurements include photonic (Roberts 209, Jen) and electronic (EE B052, Parviz) techniques.

 

Femto-Second Pulse Laser System for Non-linear Optical Measurements (Supervisor: Jen)	Dip-Pen Lithography System (NScriptor, Nanoink, Inc.) (Supervisor: Ginger)	Cryogenic Probe Station for Low-Noise Electrical Measurements (Supervisor: Parviz)